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Publication
576views
17 years 6 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
CVPR
2009
IEEE
17 years 2 months ago
Recognizing Linked Events: Searching the Space of Feasible Explanations
The ambiguity inherent in a localized analysis of events from video can be resolved by exploiting constraints between events and examining only feasible global explanations. We sho...
Dima Damen (University of Leeds), David Hogg (Univ...
CVPR
2009
IEEE
17 years 1 months ago
Isometric Registration of Ambiguous and Partial Data
This paper introduces a new shape matching algorithm for computing correspondences between 3D surfaces that have undergone (approximately) isometric deformations. The new approach ...
Art Tevs (Max Planck Institute Informatik), Martin...

Publication
922views
17 years 1 months ago
Multi-Class Active Learning for Image Classification
One of the principal bottlenecks in applying learning techniques to classification problems is the large amount of labeled training data required. Especially for images and video, ...
Ajay J. Joshi, Fatih Porikli, Nikolaos Papanikolop...
ICCV
2009
IEEE
1957views Computer Vision» more  ICCV 2009»
16 years 11 months ago
Robust Visual Tracking using L1 Minimization
In this paper we propose a robust visual tracking method by casting tracking as a sparse approximation problem in a particle filter framework. In this framework, occlusion, corru...
Xue Mei, Haibin Ling