102 search results - page 11 / 21 » Fault Detection Likelihood of Test Sequence Length |
161
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DSD
2009
IEEE
16 years 19 days ago
2009
IEEE
—Long test application time and high temperature have become two major issues of system-on-chip (SoC) test. In order to minimize test application times and avoid overheating duri...
128
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DAC
1996
ACM
15 years 10 months ago
1996
ACM
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
178
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SEFM
2005
IEEE
15 years 11 months ago
2005
IEEE
The development of test cases is an important issue for testing software, communication protocols and other reactive systems. A number of methods are known for the development of ...
182
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GCB
2000
Springer
15 years 9 months ago
2000
Springer
Conventional phylogenetic tree estimation methods assume that all sites in a DNA multiple alignment have the same evolutionary history. This assumption is violated in data sets fro...
181
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ITC
1994
IEEE
15 years 10 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...