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SIGGRAPH
2010
ACM
15 years 11 months ago
Non-local scan consolidation for 3D urban scenes
Recent advances in scanning technologies, in particular devices that extract depth through active sensing, allow fast scanning of urban scenes. Such rapid acquisition incurs imper...
Qian Zheng, Andrei Sharf, Guowei Wan, Yangyan Li, ...
230
Voted
CVPR
2010
IEEE
15 years 11 months ago
Model Globally, Match Locally: Efficient and Robust 3D Object Recognition
This paper addresses the problem of recognizing freeform 3D objects in point clouds. Compared to traditional approaches based on point descriptors, which depend on local informati...
Bertram Drost, Markus Ulrich, Nassir Navab, Slobod...
195
Voted
ICCAD
1996
IEEE
164views Hardware» more  ICCAD 1996»
15 years 11 months ago
A novel dimension reduction technique for the capacitance extraction of 3D VLSI interconnects
In this paper, we present a new capacitance extraction method named Dimension Reduction Technique (DRT) for 3D VLSI interconnects. The DRT converts a complex 3D problem into a ser...
Wei Hong II, Weikai Sun, Zhenhai Zhu, Hao Ji, Ben ...
171
Voted
ECCV
2010
Springer
15 years 10 months ago
Binary coherent edge descriptors
Patch descriptors are used for a variety of tasks ranging from finding corresponding points across images, to describing object category parts. In this paper, we propose an image ...
DAC
2005
ACM
15 years 8 months ago
Piece-wise approximations of RLCK circuit responses using moment matching
Capturing RLCK circuit responses accurately with existing model order reduction (MOR) techniques is very expensive. Direct metrics for fast analysis of RC circuits exist but there...
Chirayu S. Amin, Yehea I. Ismail, Florentin Dartu