Recent advances in scanning technologies, in particular devices that extract depth through active sensing, allow fast scanning of urban scenes. Such rapid acquisition incurs imper...
Qian Zheng, Andrei Sharf, Guowei Wan, Yangyan Li, ...
This paper addresses the problem of recognizing freeform 3D objects in point clouds. Compared to traditional approaches based on point descriptors, which depend on local informati...
Bertram Drost, Markus Ulrich, Nassir Navab, Slobod...
In this paper, we present a new capacitance extraction method named Dimension Reduction Technique (DRT) for 3D VLSI interconnects. The DRT converts a complex 3D problem into a ser...
Wei Hong II, Weikai Sun, Zhenhai Zhu, Hao Ji, Ben ...
Patch descriptors are used for a variety of tasks ranging from finding corresponding points across images, to describing object category parts. In this paper, we propose an image ...
Capturing RLCK circuit responses accurately with existing model order reduction (MOR) techniques is very expensive. Direct metrics for fast analysis of RC circuits exist but there...