12272 search results - page 2226 / 2455 » Experimental program analysis |
161
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ICCD
2007
IEEE
16 years 3 months ago
2007
IEEE
In this paper, we propose a novel on-chip voltage drop reduction technique for on-chip power delivery networks of VLSI systems in the presence of variational leakage current sourc...
172
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ICCD
2001
IEEE
16 years 3 months ago
2001
IEEE
Dynamic power is the main source of power consumption in CMOS circuits. It depends on the square of the supply voltage. It may significantly be reduced by scaling down the supply ...
130
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
- Redundant via insertion and line end extension employed in the post-routing stage are two well known and highly recommended techniques to reduce yield loss due to via failure. Ho...
206
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ICCAD
2002
IEEE
16 years 3 months ago
2002
IEEE
Optimized solvers for the Boolean Satisfiability (SAT) problem have many applications in areas such as hardware and software verification, FPGA routing, planning, etc. Further use...
178
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ICCAD
2002
IEEE
16 years 3 months ago
2002
IEEE
We propose to introduce redundant interconnects for manufacturing yield and reliability improvement. By introducing redundant interconnects, the potential for open faults is reduc...