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DASFAA
2006
IEEE
16 years 1 months ago
2006
IEEE
Outlier analysis is an important task in data mining and has attracted much attention in both research and applications. Previous work on outlier detection involves different type...
193
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, eq...
164
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
154
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
This paper presents STAX, a crosstalk target set compaction framework to reduce the complexity of the crosstalk ATPG process by pruning non-fault-producing targets. In general, ex...
152
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
Built-in self-repair (BISR) technique is gaining popular for repairing embedded memory cores in system-onchips (SOCs). To increase the utilization of memory redundancy, the BISR t...