12272 search results - page 1940 / 2455 » Experimental program analysis |
156
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ICCAD
2007
IEEE
16 years 3 months ago
2007
IEEE
— As nanometer technology advances, the post-CMP dielectric thickness variation control becomes crucial for manufacturing closure. To improve CMP quality, dummy feature filling ...
170
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
— For 65nm and below devices, even after optical proximity correction (OPC), the gate may still be non-rectangular. There are several limited works on the device and circuit char...
199
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ICCAD
2004
IEEE
16 years 3 months ago
2004
IEEE
New embedded systems offer rich power management features in the form of multiple operational and non-operational power modes. While they offer mechanisms for better energy effic...
161
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ICCAD
2003
IEEE
16 years 3 months ago
2003
IEEE
In this paper, we present an integrated approach to floorplanning and bus planning, i.e., bus-driven floorplanning (BDF). We are given a set of circuit blocks and the bus speci...
185
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IUI
2009
ACM
16 years 3 months ago
2009
ACM
Many websites use tags as a mechanism for improving item metadata through collective user effort. Users of tagging systems often apply far more tags to an item than a system can ...