2598 search results - page 341 / 520 » Experimental Design for Variable Selection in Data Bases |
197
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HPCA
2006
IEEE
16 years 6 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
156
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IOLTS
2005
IEEE
16 years 1 days ago
2005
IEEE
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
159
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CHI
2004
ACM
16 years 6 months ago
2004
ACM
The UK e-Science programme is relying on the evolution of the paper lab book into a pervasive data gathering lab system. To date take up of existing commercial or research lab boo...
194
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MIR
2004
ACM
15 years 12 months ago
2004
ACM
In content-based image retrieval, relevance feedback has been introduced to narrow the gap between low-level image feature and high-level semantic concept. Furthermore, to speed u...
138
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
ion Refinement by Controllability and Cooperativeness Analysis Freddy Y.C. Mang and Pei-Hsin Ho Advanced Technology Group, Synopsys, Inc. {fmang, pho}@synopsys.com nt a new abstrac...