9267 search results - page 1569 / 1854 » Expectation-Oriented Analysis and Design |
198
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DAC
2008
ACM
16 years 7 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
192
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DAC
2003
ACM
16 years 7 months ago
2003
ACM
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
207
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KDD
2006
ACM
16 years 7 months ago
2006
ACM
KDD is a complex and demanding task. While a large number of methods has been established for numerous problems, many challenges remain to be solved. New tasks emerge requiring th...
214
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KDD
2003
ACM
16 years 7 months ago
2003
ACM
Support vector machines (SVMs) have been promising methods for classification and regression analysis because of their solid mathematical foundations which convey several salient ...
183
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CHI
2006
ACM
16 years 7 months ago
2006
ACM
Many users are familiar with the interesting but limited functionality of Data Detector interfaces like Microsoft's Smart Tags and Google's AutoLink. In this paper we si...