502 search results - page 64 / 101 » Evolving Hardware on a Large Scale |
173
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DATE
2008
IEEE
16 years 16 days ago
2008
IEEE
Single-electron devices have drawn much attention in the last two decades. They have been widely used for device research and also show promise as a potential alternative to compl...
162
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DATE
2008
IEEE
16 years 16 days ago
2008
IEEE
Despite the growing research effort in formal verification, constraint-based random simulation remains an integral part of design validation, especially for large design componen...
141
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DATE
2007
IEEE
16 years 13 days ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
109
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DATE
2006
IEEE
16 years 4 days ago
2006
IEEE
Functional unit shutdown based on MTCMOS devices is effective for leakage reduction in aggressively scaled technologies. However, the applicability of MTCMOS-based shutdown in a s...
155
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IPPS
2006
IEEE
16 years 3 days ago
2006
IEEE
The Replica Exchange method is a popular approach for studying the folding thermodynamics of small to modest size proteins in explicit solvent, since it is easily parallelized. Ho...