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ICCAD
2003
IEEE
151views Hardware» more  ICCAD 2003»
15 years 11 months ago
On Compacting Test Response Data Containing Unknown Values
The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Janu...
WABI
2001
Springer
15 years 11 months ago
A Chemical-Distance-Based Test for Positive Darwinian Selection
There are very few instances in which positive Darwinian selection has been convincingly demonstrated at the molecular level. In this study, we present a novel test for detecting p...
Tal Pupko, Roded Sharan, Masami Hasegawa, Ron Sham...
ITC
1995
IEEE
122views Hardware» more  ITC 1995»
15 years 10 months ago
A Fault Model and a Test Method for Analog Fuzzy Logic Circuits
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
Stefan Weiner
ICST
2009
IEEE
15 years 4 months ago
A Flexible Framework for Quality Assurance of Software Artefacts with Applications to Java, UML, and TTCN-3 Test Specifications
Manual reviews and inspections of software artefacts are time consuming and thus, automated analysis tools have been developed to support the quality assurance of software artefac...
Jens Nodler, Helmut Neukirchen, Jens Grabowski
LATA
2009
Springer
16 years 1 months ago
Membership Testing: Removing Extra Stacks from Multi-stack Pushdown Automata
We show that fixed membership testing for many interesting subclasses of multi-pushdown machines is no harder than for pushdowns with single stack. The models we consider are MVPA...
Nutan Limaye, Meena Mahajan