Sciweavers

4167 search results - page 81 / 834
» Evolutionary functional testing
Sort
View
ATS
2000
IEEE
87views Hardware» more  ATS 2000»
15 years 10 months ago
Functional Testing of Microprocessors with Graded Fault Coverage
Rajesh Kannah, C. P. Ravikumar
APAQS
2001
IEEE
15 years 10 months ago
A Selective Software Testing Method Based on Priorities Assigned to Functional Modules
Masayuki Hirayama, Tetsuya Yamamoto, Jiro Okayasu,...
ASPDAC
1995
ACM
58views Hardware» more  ASPDAC 1995»
15 years 9 months ago
A tool for measuring quality of test pattern for LSIs' functional design
Takashi Aoki, Tomoji Toriyama, Kenji Ishikawa, Ken...
VLSID
1995
IEEE
107views VLSI» more  VLSID 1995»
15 years 9 months ago
Functional test generation for non-scan sequential circuits
Mandyam-Komar Srinivas, James Jacob, Vishwani D. A...