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SIAMCOMP
2011
14 years 9 months ago
An Expansion Tester for Bounded Degree Graphs
We consider the problem of testing graph expansion (either vertex or edge) in the bounded degree model [10]. We give a property tester that given a graph with degree bound d, an ex...
Satyen Kale, C. Seshadhri
ICCV
2011
IEEE
14 years 6 months ago
Learning to Cluster Using High Order Graphical Models with Latent Variables
This paper proposes a very general max-margin learning framework for distance-based clustering. To this end, it formulates clustering as a high order energy minimization problem w...
Nikos Komodakis
ESSCIRC
2011
93views more  ESSCIRC 2011»
14 years 6 months ago
12% Power reduction by within-functional-block fine-grained adaptive dual supply voltage control in logic circuits with 42 volta
— Within-functional-block fine-grained adaptive dual supply voltage control (FADVC) is proposed to reduce the power of CMOS logic circuits. Both process and design variations wi...
Atsushi Muramatsu, Tadashi Yasufuku, Masahiro Nomu...
DEXAW
2009
IEEE
173views Database» more  DEXAW 2009»
16 years 1 months ago
Automatic Cluster Number Selection Using a Split and Merge K-Means Approach
Abstract—The k-means method is a simple and fast clustering technique that exhibits the problem of specifying the optimal number of clusters preliminarily. We address the problem...
Markus Muhr, Michael Granitzer
ICDAR
2011
IEEE
14 years 6 months ago
Non-rigid Registration and Restoration of Double-Sided Historical Manuscripts
This paper presents a fully automatic framework for the restoration of double-sided historical manuscripts which are impaired by ink bleed-through distortions. First, the recto si...
Jie Wang, Chew Lim Tan