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SNPD
2003
15 years 8 months ago
An Industrial Experience in Comparing Manual vs. Automatic Test Cases Generation
We present our experience in automatically deriving a detailed test case plan exclusively using the UML diagrams developed during the analysis and design phases. We consider in pa...
Francesca Basanieri, Pierpaolo Iani, Gaetano Lomba...
BMCBI
2007
113views more  BMCBI 2007»
15 years 6 months ago
Statistical power of phylo-HMM for evolutionarily conserved element detection
Background: An important goal of comparative genomics is the identification of functional elements through conservation analysis. Phylo-HMM was recently introduced to detect conse...
Xiaodan Fan, Jun Zhu, Eric E. Schadt, Jun S. Liu
DSN
2000
IEEE
15 years 11 months ago
Robustness Testing of the Microsoft Win32 API
Although Microsoft Windows is being deployed in mission-critical applications, little quantitative data has been published about its robustness. We present the results of executin...
Charles P. Shelton, Philip Koopman, Kobey Devale
ETS
2006
IEEE
113views Hardware» more  ETS 2006»
16 years 18 days ago
Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism
This paper proposes a wrapper design for interconnects with guaranteed bandwidth and latency services and on-chip protocol. strate that these interconnects abstract the interconne...
Alexandre M. Amory, Kees Goossens, Erik Jan Marini...
ATS
2000
IEEE
116views Hardware» more  ATS 2000»
15 years 11 months ago
An experimental analysis of spot defects in SRAMs: realistic fault models and tests
: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...
Said Hamdioui, A. J. van de Goor