4167 search results - page 187 / 834 » Evolutionary functional testing |
126
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DATE
2008
IEEE
16 years 28 days ago
2008
IEEE
This paper presents a wrapper and TAM co-optimization method for reuse of SoC functional interconnects to minimize test time under area constraint. The proposed method consists of...
158
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ISTCS
1995
Springer
15 years 10 months ago
1995
Springer
A low-degree test is a collection of simple, local rules for checking the proximity of an arbitrary function to a lowdegree polynomial. Each rule depends on the function’s value...
178
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TR
2008
15 years 6 months ago
2008
Abstract--This paper gives a reliability sampling plan for progressively type I interval censored life tests when the lifetime follows the exponential distribution. We use the maxi...
163
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BMCBI
2007
15 years 6 months ago
2007
Background: With the popularisation of high-throughput techniques, the need for procedures that help in the biological interpretation of results has increased enormously. Recently...
169
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ICST
2008
IEEE
16 years 27 days ago
2008
IEEE
This paper presents a method of component testing based on algebraic specifications. An algorithm for generating checkable test cases is proposed. A prototype testing tool called ...