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177
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VLSID
2009
IEEE
16 years 7 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
173
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VLSID
2003
IEEE
16 years 7 months ago
2003
IEEE
We consider the problem of minimizing the delay in transporting a signal across a distance in a VLSI circuit.The problem can be restated as a combined buffer insertion, buffer siz...
176
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CIS
2005
Springer
16 years 11 days ago
2005
Springer
Abstract. Multi-layer perceptrons (MLPs) have been widely used in classification and regression task. How to improve the training speed of MLPs has been an interesting field of res...
165
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ISNN
2005
Springer
16 years 9 days ago
2005
Springer
In least squares support vector (LS-SVM), the key challenge lies in the selection of free parameters such as kernel parameters and tradeoff parameter. However, when a large number ...
155
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SWAT
2004
Springer
16 years 5 days ago
2004
Springer
For n disjoint line segments in the plane we can construct a binary encompassing tree such that every vertex is pointed, what’s more, at every segment endpoint all incident edges...