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131
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EVOW
2008
Springer
15 years 8 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
179
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GRAMMARS
2002
15 years 6 months ago
2002
Recent models of natural language processing employ statistical reasoning for dealing with the ambiguity of formal grammars. In this approach, statistics, concerning the various li...
135
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WSC
2008
15 years 8 months ago
2008
The use of simulation as a modeling and analysis tool is wide spread. Simulation is an enabling tool for experimenting virtually on a validated computer environment. Often the und...
156
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ICMCS
2006
IEEE
16 years 14 days ago
2006
IEEE
This paper proposes a novel analytical model to predict zero quantized DCT coefficients for fast video encoding. The dynamic range of quantized DCT coefficients are analyzed and...
186
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ECCV
2010
Springer
15 years 7 months ago
2010
Springer
Abstract. We consider the minimization of a smooth convex function regularized by the mixture of prior models. This problem is generally difficult to solve even each simpler regula...