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ICCAD
2010
IEEE
186views Hardware» more  ICCAD 2010»
15 years 4 months ago
Application-Aware diagnosis of runtime hardware faults
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
Andrea Pellegrini, Valeria Bertacco
ICDM
2010
IEEE
125views Data Mining» more  ICDM 2010»
15 years 4 months ago
Topic Modeling Ensembles
: Topic Modeling Ensembles Zhiyong Shen, Ping Luo, Shengwen Yang, Xukun Shen HP Laboratories HPL-2010-158 Topic model, Ensemble In this paper we propose a framework of topic model...
Zhiyong Shen, Ping Luo, Shengwen Yang, Xukun Shen
ICDM
2010
IEEE
228views Data Mining» more  ICDM 2010»
15 years 4 months ago
Multi-label Feature Selection for Graph Classification
Nowadays, the classification of graph data has become an important and active research topic in the last decade, which has a wide variety of real world applications, e.g. drug acti...
Xiangnan Kong, Philip S. Yu
ICDM
2010
IEEE
108views Data Mining» more  ICDM 2010»
15 years 4 months ago
Assessing Data Mining Results on Matrices with Randomization
Abstract--Randomization is a general technique for evaluating the significance of data analysis results. In randomizationbased significance testing, a result is considered to be in...
Markus Ojala
ICDM
2010
IEEE
115views Data Mining» more  ICDM 2010»
15 years 4 months ago
Polishing the Right Apple: Anytime Classification Also Benefits Data Streams with Constant Arrival Times
Classification of items taken from data streams requires algorithms that operate in time sensitive and computationally constrained environments. Often, the available time for class...
Jin Shieh, Eamonn J. Keogh
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