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209
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DATE
2010
IEEE
15 years 12 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
166
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DATE
2010
IEEE
15 years 12 months ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
180
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DATE
2010
IEEE
15 years 12 months ago
2010
IEEE
— The use of dynamic voltage and frequency scaling (DVFS) in contemporary multicores provides significant protection from unpredictable thermal events. A side effect of DVFS can ...
159
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DATE
2010
IEEE
15 years 12 months ago
2010
IEEE
: Scaling down in very deep submicron (VDSM) technologies increases the delay, power consumption of on-chip interconnects, while the reliability and yield decrease. In high perform...
167
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ITNG
2010
IEEE
15 years 12 months ago
2010
IEEE
A number of routing metrics have been proposed to select a path with better performance in wireless mesh networks. Most of them partially rely on link loss rates when evaluating t...