In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...
Jangwoo Kim, Nikos Hardavellas, Ken Mai, Babak Fal...
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
In this paper, we develop a robust bit-plane watermarking technique based on zerotree coding. A robust watermark is an imperceptible but indelible code that can be used for owners...
This paper discusses three techniques useful in relaxing the constraints imposed by control flow on parallelism: control dependence analysis, executing multiple flows of control s...
Prior work has shown that collapsible pipelining techniques have the potential to significantly reduce clocking activity, which can consume up to 70% of the dynamic power in moder...