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ISSRE
2007
IEEE
15 years 7 months ago
Using In-Process Testing Metrics to Estimate Post-Release Field Quality
In industrial practice, information on the software field quality of a product is available too late in the software lifecycle to guide affordable corrective action. An important ...
Nachiappan Nagappan, Laurie Williams, Mladen A. Vo...
ISPASS
2007
IEEE
16 years 8 days ago
Accelerating Full-System Simulation through Characterizing and Predicting Operating System Performance
The ongoing trend of increasing computer hardware and software complexity has resulted in the increase in complexity and overheads of cycle-accurate processor system simulation, e...
Seongbeom Kim, Fang Liu, Yan Solihin, Ravi R. Iyer...
CP
2007
Springer
16 years 5 days ago
Hierarchical Hardness Models for SAT
Abstract. Empirical hardness models are a recent approach for studying NP-hard problems. They predict the runtime of an instance using efficiently computable features. Previous res...
Lin Xu, Holger H. Hoos, Kevin Leyton-Brown
ETS
2010
IEEE
150views Hardware» more  ETS 2010»
15 years 4 months ago
Predicting dynamic specifications of ADCs with a low-quality digital input signal
— A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A noisy and nonlinear pulse is applied as the test stimulus, which is suitable for...
Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff
GLOBECOM
2006
IEEE
16 years 1 days ago
Low-Complexity Adaptive High-Resolution Channel Prediction for OFDM Systems
Abstract— We propose a low-complexity adaptive highresolution channel prediction algorithm for pilot symbol assisted orthogonal frequency division multiplexing (OFDM) systems. Th...
Ian C. Wong, Brian L. Evans