6289 search results - page 130 / 1258 » Error Sequence Analysis |
144
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ICCD
2008
IEEE
16 years 3 months ago
2008
IEEE
- This paper performs analysis and design of latches and flip-flops while considering the effect of event upsets caused by energetic particle hits. First it is shown that the conve...
153
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BMCBI
2007
15 years 6 months ago
2007
Background: By virtue of their shared ancestry, homologous sequences are similar in their structure and function. Consequently, multiple sequence alignments are routinely used to ...
170
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IOLTS
2007
IEEE
16 years 15 days ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...