1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
? The economic viability of the reusable core-based design paradigm depends on the development of techniques for intellectual property protection. We introduce the first dynamic wa...
This paper proposes a general hierarchical analysis methodology, HiPRIME, to efficiently analyze RLKC power delivery systems. After partitioning the circuits into blocks, we devel...
Yahong Cao, Yu-Min Lee, Tsung-Hao Chen, Charlie Ch...
The major concerns in state-of-the-art model reduction algorithms are: achieving accurate models of sufficiently small size, numerically stable and efficient generation of the mod...
Joel R. Phillips, Luca Daniel, Luis Miguel Silveir...
The need for low-power, small factor secondary storage device has led to the widespread use of flash memory in embedded systems. The energy consumption of processor and flash base...