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175
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ISPASS
2007
IEEE
16 years 1 months ago
2007
IEEE
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
234
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SEFM
2007
IEEE
16 years 1 months ago
2007
IEEE
This paper presents an implicitly-typed functional, aspect-oriented programming language: λ AOP. The main contribution of the paper is a semantics for λ AOP advice weaving. The ...
193
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SEW
2007
IEEE
16 years 1 months ago
2007
IEEE
: After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and...
161
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TASE
2007
IEEE
16 years 1 months ago
2007
IEEE
Bounded model checking (BMC) based on SAT has been introduced as a complementary method to BDD-based symbolic model checking of LTL and ACTL properties in recent years. For genera...
171
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FASE
2007
Springer
16 years 1 months ago
2007
Springer
The Declared Type Generalization Checker is a plug-in for Eclipse’s Java Development Tools (JDT) that supports developers in systematically finding and using better fitting types...