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APSEC
2009
IEEE
16 years 2 months ago
Test Coverage Metric for Two-Staged Language with Abstract Interpretation
Taeksu Kim, Chunwoo Lee, Kiljoo Lee, Soohyun Baik,...
FASE
2009
Springer
16 years 2 months ago
Describing and Analyzing Behaviours over Tabular Specifications Using (Dyn)Alloy
Nazareno Aguirre, Marcelo F. Frias, Mariano M. Mos...
FASE
2009
Springer
16 years 2 months ago
Proving Consistency of Pure Methods and Model Fields
Abstract. Pure methods and model fields are useful and common speci
K. Rustan M. Leino, Ronald Middelkoop
KBSE
2009
IEEE
16 years 1 months ago
Clone-Aware Configuration Management
Tung Thanh Nguyen, Hoan Anh Nguyen, Nam H. Pham, J...
ADAEUROPE
2009
Springer
16 years 1 months ago
Formal Verification of AADL Specifications in the Topcased Environment
Bernard Berthomieu, Jean-Paul Bodeveix, Christelle...