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ICEIS
2005
IEEE
15 years 11 months ago
2005
IEEE
178
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SP
2010
IEEE
15 years 10 months ago
2010
IEEE
—Fuzz testing has proven successful in finding security vulnerabilities in large programs. However, traditional fuzz testing tools have a well-known common drawback: they are in...
IEEESP
2006
15 years 6 months ago
2006
152
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DATE
2008
IEEE
16 years 19 days ago
2008
IEEE
This paper presents a method of dynamic voltage scaling (DVS) that tackles both switching and leakage power with combined Vdd/Vbs scaling and gives minimum average energy consumpt...