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146
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ISCA
2010
IEEE
15 years 11 months ago
2010
IEEE
As technology scales ever further, device unreliability is creating excessive complexity for hardware to maintain the illusion of perfect operation. In this paper, we consider whe...
171
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CODES
2004
IEEE
15 years 10 months ago
2004
IEEE
The memory bandwidth largely determines the performance and energy cost of embedded systems. At the compiler level, several techniques improve the memory bandwidth at the scope of...
148
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JCC
2011
15 years 1 months ago
2011
: The Poisson–Boltzmann equation (PBE) is an established model for the electrostatic analysis of biomolecules. The development of advanced computational techniques for the soluti...
183
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ISPDC
2010
IEEE
15 years 4 months ago
2010
IEEE
—Super-scalar, out-of-order processors that can have tens of read and write requests in the execution window place significant demands on Memory Level Parallelism (MLP). Multi- ...
180
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ICCAD
2010
IEEE
15 years 4 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...