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DSD
2007
IEEE
98views Hardware» more  DSD 2007»
16 years 9 days ago
Fault Diagnosis in Integrated Circuits with BIST
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evart...
TIFS
2008
120views more  TIFS 2008»
15 years 5 months ago
Determining Image Origin and Integrity Using Sensor Noise
In this paper, we provide a unified framework for identifying the source digital camera from its images and for revealing digitally altered images using photo-response nonuniformit...
Mo Chen, Jessica J. Fridrich, Miroslav Goljan, Jan...
FORTE
1997
15 years 7 months ago
A Framework for Distributed Object-Oriented Testing
Distributed programming and object-oriented programming are two popular programming paradigms. The former is driven by advances in networking technology whereas the latter provide...
Alan C. Y. Wong, Samuel T. Chanson, Shing-Chi Cheu...
DATE
2000
IEEE
87views Hardware» more  DATE 2000»
15 years 10 months ago
Test Synthesis for Mixed-Signal SOC Paths
Higher levels of integration, the need for test re-use, and the mixed-signal nature of today’s SOC’s necessitate hierarchical test generation and system level test composition...
Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu
ESCIENCE
2007
IEEE
16 years 9 days ago
An Integrated Grid Development Environment in Eclipse
With the proliferation of Grid computing, a large number of computational resources are available for solving complex scientific and engineering problems. Nevertheless, it is non-...
Donny Kurniawan, David Abramson