A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
The statistical variations in electrical parameters, such as transistor gain factors and interconnect resistances, due to variations in the manufacturing process are studied using...
Suriyaprakash Natarajan, Melvin A. Breuer, Sandeep...
A major difficulty of heterogeneous process migration is how to collect advanced dynamic data-structures, transform them into machine independent form, and restor them appropriate...
- Most image processing applications are computationally intensive and data intensive. Reconfigurable hardware boards provide a convenient and flexible solution to speed up these a...
The synthesis of clock network in the presence of process variation is becoming a vital design issue towards the performance of digital circuits. In this paper, we propose a clock ...