Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
Sayeed A. Badrudduza, Ziyan Wang, Giby Samson, Law...
Current Radio Frequency Identification (RFID) systems generally have long design times and low tolerance to changes in specification. This paper describes a field programmable,...
Alex K. Jones, Raymond R. Hoare, Swapna R. Donthar...
Performance and power consumption of an on-chip interconnect that forms the backbone of Chip Multiprocessors (CMPs), are directly influenced by the underlying network topology. Bo...
Reetuparna Das, Soumya Eachempati, Asit K. Mishra,...
In this paper, we aim to analyse the current level of usability on ten popular online websites utilising some kind of reputation system. The conducted heuristic and expert evaluat...
Bart P. Knijnenburg, Lars Schmidt-Thieme, Dirk G. ...
Background: Neoplastic transformation is a multistep process in which distinct gene products of specific cell regulatory pathways are involved at each stage. Identification of ove...