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DATE
2005
IEEE
132views Hardware» more  DATE 2005»
15 years 11 months ago
An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories
Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey
ISQED
2005
IEEE
91views Hardware» more  ISQED 2005»
15 years 11 months ago
Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning
Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Gh...
KR
2010
Springer
15 years 10 months ago
Efficient Dominance Testing for Unconditional Preferences
Ganesh Ram Santhanam, Samik Basu, Vasant Honavar
FOCS
1999
IEEE
15 years 10 months ago
Efficient Testing of Large Graphs
Noga Alon, Eldar Fischer, Michael Krivelevich, Mar...