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ISSTA
2009
ACM
16 years 15 days ago
Efficient mutation testing by checking invariant violations
David Schuler, Valentin Dallmeier, Andreas Zeller
ISQED
2007
IEEE
120views Hardware» more  ISQED 2007»
16 years 8 days ago
A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays
Nigel Drego, Anantha Chandrakasan, Duane S. Boning
KBSE
2007
IEEE
16 years 8 days ago
Efficiently monitoring data-flow test coverage
Raúl A. Santelices, Mary Jean Harrold