4192 search results - page 346 / 839 » Efficient testing of groups |
154
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DATE
2005
IEEE
16 years 12 days ago
2005
IEEE
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in futu...
189
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ICMCS
2005
IEEE
16 years 11 days ago
2005
IEEE
In this paper, a method for content-based retrieval of JPEG images is presented, utilizing features directly from the discrete cosine transform (DCT) domain. Image indexing is ach...
170
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SCAM
2005
IEEE
16 years 10 days ago
2005
IEEE
This paper presents an optimisation technique which automatically inlines certain classes within their enclosing class. Inlining a class involves inserting the fields and methods ...
158
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GECCO
2005
Springer
16 years 9 days ago
2005
Springer
Differential evolution (DE) is well known as a simple and efficient scheme for global optimization over continuous spaces. In this paper we present two new, improved variants of D...
232
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TAINN
2005
Springer
16 years 7 days ago
2005
Springer
Satisfiability problem is an NP-complete problem that finds itself or its variants in many combinatorial problems. There exist many complete algorithms that give successful results...