1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wund...
Experimentally driven research for wireless sensor networks is invaluable to provide benchmarking and comparison of new ideas. An increasingly common tool in support of this is a t...
Tobias Baumgartner, Ioannis Chatzigiannakis, Maick...
As Field Programmable Gate Arrays (FPGAs) have reached capacities beyond millions of equivalent gates, it becomes possible to accelerate floating-point scientific computing applica...
Platform-based design represents the most widely used approach to design System-On-Chip (SOC) applications. In this context, the Design Space Exploration (DSE) phase consists of o...
This paper examines the opportunity of using compression for accelerating the (re)configuration of FPGA devices, focusing on the choice of compression algorithms, and their hardwa...