We present an efficient algorithm for identification of two-line bridges in combinational CMOS logic that narrows down the two-line bridge candidates based on tester responses for...
Thomas J. Vogels, Wojciech Maly, R. D. (Shawn) Bla...
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Ki...
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...
The growing adoption of reconfigurable architectures opens new implementation alternatives and creates new design challenges. In the case of dynamically reconfigurable architectur...
—This paper presents a 90 nm CMOS digital amplitude modulator for polar transmitter. It reaches an output power of -2.5 dBmRMS using a WLAN OFDM 64QAM modulation at 2.45GHz achie...