2620 search results - page 267 / 524 » Efficient Hardware Voxelization |
184
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ISQED
2006
IEEE
16 years 20 days ago
2006
IEEE
Due to aggressive technology scaling, VLSI circuits are becoming increasingly susceptible to transient errors caused by single-event-upsets (SEUs). In this paper, we introduce two...
146
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ATS
2005
IEEE
16 years 8 days ago
2005
IEEE
: This paper addresses the challenges imposed on current testing with the advent of Nanotechnologies. It shows why existing measurement solutions embedded in ATE systems are not ad...
178
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DATE
2005
IEEE
16 years 8 days ago
2005
IEEE
In signal integrity analysis, the joint effect of propagated noise through library cells, and of the noise injected on a quiet net by neighboring switching nets through coupling c...
164
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DATE
2005
IEEE
16 years 8 days ago
2005
IEEE
A technique based on the sensitivity of the output to input waveform is presented for accurate propagation of delay information through a gate for the purpose of static timing ana...
149
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DATE
2005
IEEE
16 years 8 days ago
2005
IEEE
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in futu...