A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
: An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the R...
Designing asynchronous circuits by reusing existing synchronous tools has become a promising solution to the problem of poor CAD support in asynchronous world. A straightforward w...
—This paper presents a high-performance CAVLC decoding VLSI architecture for MPEG-4 AVC/H.264. Instead of just skipping zero block, the proposed design explores the features of C...
This paper presents a unique SEU (single Event Upset) mitigation technique based upon Temporal Data Sampling for synchronous circuits and configuration bit storage for programmabl...