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DATE
2006
IEEE
82views Hardware» more  DATE 2006»
16 years 21 days ago
Concurrent core test for SOC using shared test set and scan chain disable
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
Gang Zeng, Hideo Ito
DDECS
2006
IEEE
101views Hardware» more  DDECS 2006»
16 years 21 days ago
Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits
: An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the R...
Guoyan Zhang, Ronan Farrell
ICCAD
2006
IEEE
146views Hardware» more  ICCAD 2006»
16 years 21 days ago
Cost-aware synthesis of asynchronous circuits based on partial acknowledgement
Designing asynchronous circuits by reusing existing synchronous tools has become a promising solution to the problem of poor CAD support in asynchronous world. A straightforward w...
Yu Zhou, Danil Sokolov, Alexandre Yakovlev
ISCAS
2006
IEEE
97views Hardware» more  ISCAS 2006»
16 years 20 days ago
A zero-skipping multi-symbol CAVLC decoder for MPEG-4 AVC/H.264
—This paper presents a high-performance CAVLC decoding VLSI architecture for MPEG-4 AVC/H.264. Instead of just skipping zero block, the proposed design explores the features of C...
Guo-Shiuan Yu, Tian-Sheuan Chang
ISQED
2006
IEEE
118views Hardware» more  ISQED 2006»
16 years 20 days ago
Design of a Single Event Upset (SEU) Mitigation Technique for Programmable Devices
This paper presents a unique SEU (single Event Upset) mitigation technique based upon Temporal Data Sampling for synchronous circuits and configuration bit storage for programmabl...
Sajid Baloch, Tughrul Arslan, Adrian Stoica