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ICCD
2005
IEEE
124views Hardware» more  ICCD 2005»
16 years 3 months ago
Accurate Diagnosis of Multiple Faults
In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective si...
Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng
ICCD
2005
IEEE
135views Hardware» more  ICCD 2005»
16 years 3 months ago
Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults
In this paper, we make two major contributions: First, to enhance Boolean learning, we propose a new class of logic implications called extended forward implications. Using a nove...
Manan Syal, Rajat Arora, Michael S. Hsiao
ICCD
2004
IEEE
91views Hardware» more  ICCD 2004»
16 years 3 months ago
Diagnosis of Hold Time Defects
In modern technologies, process variations can be quite substantial, often causing design timing failures. It is essential that those errors be correctly and quickly diagnosed. In...
Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han T...
ICCD
2004
IEEE
103views Hardware» more  ICCD 2004»
16 years 3 months ago
A Fast Delay Analysis Algorithm for The Hybrid Structured Clock Network
This paper presents a novel approach to reducing the complexity of the transient linear circuit analysis for a hybrid structured clock network. Topology reduction is first used to...
Yi Zou, Yici Cai, Qiang Zhou, Xianlong Hong, Sheld...
ICCD
2002
IEEE
122views Hardware» more  ICCD 2002»
16 years 3 months ago
Using Offline and Online BIST to Improve System Dependability - The TTPC-C Example
Fault-tolerant distributed real-time systems are presently facing a lot of new challenges. Although many techniques provide effective masking of node failures on the architectural...
Andreas Steininger, Johann Vilanek