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VTS
2000
IEEE
103views Hardware» more  VTS 2000»
15 years 11 months ago
Invariance-Based On-Line Test for RTL Controller-Datapath Circuits
We present a low-cost on-line test methodology for RTL controller-datapath pairs, based on the notion of path invariance. The fundamental observation supporting the proposed metho...
Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailogl...
166
Voted
DATE
1999
IEEE
105views Hardware» more  DATE 1999»
15 years 11 months ago
Identification and Exploitation of Symmetries in DSP Algorithms
In many algorithms, particularly those in the DSP domain, certain forms of symmetry can be observed. To efficiently implement such algorithms, it is often possible to exploit thes...
C. A. J. van Eijk, E. T. A. F. Jacobs, Bart Mesman...
DATE
1999
IEEE
102views Hardware» more  DATE 1999»
15 years 11 months ago
Minimal Length Diagnostic Tests for Analog Circuits using Test History
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
Alfred V. Gomes, Abhijit Chatterjee
ITC
1996
IEEE
98views Hardware» more  ITC 1996»
15 years 10 months ago
Mixed-Mode BIST Using Embedded Processors
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
Sybille Hellebrand, Hans-Joachim Wunderlich, Andre...
ICIP
1994
IEEE
15 years 10 months ago
Very High Speed Entropy Coding
Efforts to build high-speed hardware for many different entropy coders are limited by fundamental feedback loops. Here is a method that allows for parallel compression in hardware...
Martin P. Boliek, James D. Allen, Edward L. Schwar...