703 search results - page 124 / 141 » Efficiency measurement using independent component analysis ... |
128
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ISQED
2009
IEEE
16 years 29 days ago
2009
IEEE
An on-chip test-and-measurement system with digital interfaces that can perform device-level characterization of large-dense arrays of transistors is demonstrated in 90- and 65-nm...
152
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BMCBI
2008
15 years 6 months ago
2008
Background: In microarray experiments the numbers of replicates are often limited due to factors such as cost, availability of sample or poor hybridization. There are currently fe...
184
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CVPR
2010
IEEE
16 years 2 months ago
2010
IEEE
Many of the recently popular shape based category recognition methods require stable, connected and labeled edges as input. This paper introduces a novel method to find the most st...
184
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CVPR
2009
IEEE
17 years 20 days ago
2009
IEEE
Boosted one-versus-all (OVA) classifiers are commonly used in multiclass problems, such as generic object recognition, biometrics-based identification, or gesture recognition. Join...
178
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MOBIHOC
2010
ACM
15 years 4 months ago
2010
ACM
Passive monitoring utilizing distributed wireless sniffers is an effective technique to monitor activities in wireless infrastructure networks for fault diagnosis, resource manage...