5493 search results - page 700 / 1099 » Effectively Polynomial Simulations |
157
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
—The microprocessor verification challenge becomes higher in the on-chip bus (OCB) than in the unit-level. Especially for the external interrupts, since they interface with othe...
167
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
— Three-dimensional die stacking integration provides the ability to stack multiple layers of processed silicon with a large number of vertical interconnects. Through Silicon Via...
165
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
144
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ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
— Increasingly prominent variational effects impose imminent threat to the progress of VLSI technology. This work explores redundancy, which is a well-known fault tolerance techn...
153
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ICCAD
2002
IEEE
16 years 3 months ago
2002
IEEE
As the VLSI technology scaling down, the electromigration problem becomes one of the major concerns in high-performance IC design for both power network and signal interconnects. ...