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VLSID
2000
IEEE
102views VLSI» more  VLSID 2000»
15 years 11 months ago
Inductance Characterization of Small Interconnects Using Test-Signal Method
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal
SIGSOFT
2010
ACM
15 years 4 months ago
The last mile: parallel programming and usability
Multiprocessors are now commonplace, and cloud computing is swiftly following suit. While it is possible to write high performance code for these systems, concurrency bugs are ext...
Caitlin Sadowski, Andrew Shewmaker
BMCBI
2004
139views more  BMCBI 2004»
15 years 6 months ago
Resolution of large and small differences in gene expression using models for the Bayesian analysis of gene expression levels an
Background: The detection of small yet statistically significant differences in gene expression in spotted DNA microarray studies is an ongoing challenge. Meeting this challenge r...
Jeffrey P. Townsend
JCSS
2008
81views more  JCSS 2008»
15 years 6 months ago
A simulator for adaptive parallel applications
Dynamically allocating computing nodes to parallel applications is a promising technique for improving the utilization of cluster resources. Detailed simulations can help identify...
Basile Schaeli, Sebastian Gerlach, Roger D. Hersch
CIKM
2001
Springer
15 years 11 months ago
X007: Applying 007 Benchmark to XML Query Processing Tool
If XML is to play the critical role of the lingua franca for Internet data interchange that many predict, it is necessary to start designing and adopting benchmarks allowing the c...
Stéphane Bressan, Gillian Dobbie, Zoé...