12741 search results - page 272 / 2549 » Editorial and call for papers |
169
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WCRE
2006
IEEE
16 years 21 days ago
2006
IEEE
Aspect mining tries to identify crosscutting concerns in existing systems and thus supports the adaption to an aspect-oriented design. This paper describes an automatic static asp...
157
Voted
ASPDAC
2006
ACM
16 years 20 days ago
2006
ACM
In this paper, a new flip-flop called Double-edge triggered Feedback Flip-Flop (DFFF) is proposed. The dynamic power consumption of DFFF is reduced by avoiding unnecessary interna...
155
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MOBICOM
2006
ACM
16 years 20 days ago
2006
ACM
There is a growing interest for underwater sensor networks where long term monitoring of water masses around the world for scientific, environmental, commercial, and military reas...
161
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ATS
2005
IEEE
16 years 10 days ago
2005
IEEE
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
187
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CAMP
2005
IEEE
16 years 10 days ago
2005
IEEE
Abstract— An image sensor in which each pixel has a processing element is called a vision chip. The vision chip can perform real-time visual processing at a high frame rate of 10...