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115
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DATE
2008
IEEE
16 years 27 days ago
2008
IEEE
The fraction of ICs that pass all production tests but fail in the application is called the defect level. Defect levels depend on the average number of defects per IC, and also o...
136
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IROS
2008
IEEE
16 years 25 days ago
2008
IEEE
— This paper proposes a novel concept for the image based visual control, which is called the goal-oriented just-intime visual servoing. We apply this control to ball catching ta...
163
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TIME
2008
IEEE
16 years 25 days ago
2008
IEEE
Boolean contact algebras constitute a convenient approach to a region based theory of space. In this paper we want to extend this approach to regions moving in time - called timed...
175
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COMPSAC
2007
IEEE
16 years 24 days ago
2007
IEEE
Algebraic testing is an automated software testing method based on algebraic formal specifications. It has the advantages of highly automated testing process and independence of t...
136
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IAT
2007
IEEE
16 years 23 days ago
2007
IEEE
This paper presents a model of autonomy called autonomy with regard to an attribute applicable to cognitive and not cognitive artificial agents. Three criteria (global / partial, ...