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DAC
2008
ACM
16 years 7 months ago
Scan chain clustering for test power reduction
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
DAC
2000
ACM
16 years 7 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
DAC
2003
ACM
16 years 7 months ago
Making cyclic circuits acyclic
Cyclic circuits that do not hold state or oscillate are often the most convenient representation for certain functions, such as arbiters, and can easily be produced inadvertently ...
Stephen A. Edwards
ICSE
2008
IEEE-ACM
16 years 7 months ago
From programming to modeling: our experience with a distributed software engineering course
Distributed Software Engineering (DSE) concepts in Computer Science (or Engineering) Degrees are commonly introduced using a hands-on approach mainly consisting of teaching a part...
Antonio Vallecillo, Francisco Durán, Jordi ...
CHI
2009
ACM
16 years 7 months ago
SiteLens: situated visualization techniques for urban site visits
Urban designers and urban planners often conduct site visits prior to a design activity to search for patterns or better understand existing conditions. We introduce SiteLens, an ...
Sean White, Steven Feiner