: Due to exponential increase in subthreshold leakage with technology scaling and temperature increase, leakage power is becoming a major fraction of total power in the active mode...
Leakage power is dominated by critical paths, and hence dynamic deactivation of fast transistors can yield large savings. We introduce metrics for comparing fine-grain dynamic de...
Seongmoo Heo, Kenneth C. Barr, Mark Hampton, Krste...
We study several transparent techniques for scaling dynamic content web sites, and we evaluate their relative impact when used in combination. Full transparency implies strong dat...
DRAM is facing severe scalability challenges in sub-45nm technology nodes due to precise charge placement and sensing hurdles in deep-submicron geometries. Resistive memories, suc...
Engin Ipek, Jeremy Condit, Edmund B. Nightingale, ...
—In OBS network, assembly period and burst drop rate impact the performance of the upper layer. This paper evaluates the effect of parameters of OBS network on the throughput of ...