3927 search results - page 213 / 786 » Dynamic Dependencies and Performance Improvement |
163
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IEEEPACT
2007
IEEE
16 years 29 days ago
2007
IEEE
Continued scaling of CMOS technology to smaller transistor sizes makes modern processors more susceptible to both transient and permanent hardware faults. Circuitlevel techniques ...
186
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IEAAIE
2000
Springer
15 years 10 months ago
2000
Springer
Business information received from advanced data analysis and data mining is a critical success factor for companies wishing to maximize competitive advantage. The use of tradition...
169
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IJON
2010
15 years 5 months ago
2010
Originally devoted to specific applications such as biology, medicine and demography, duration models are now widely used in economy, finance or reliability. Recent works in var...
173
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ISQED
2008
IEEE
16 years 1 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
200
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ACSAC
2006
IEEE
16 years 22 days ago
2006
IEEE
Many software security solutions require accurate tracking of control/data dependencies among information objects in network applications. This paper presents a general dynamic in...