4725 search results - page 757 / 945 » Dynamic Architecture Extraction |
155
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VLSID
2008
IEEE
16 years 7 months ago
2008
IEEE
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
173
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
Crosstalk noise in the clock network of digital circuits is often detected late in the design cycle, sometimes as late as after first silicon. It is therefore necessary to fix cros...
177
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
We present minimization methodologies and an algorithm for simultaneous scheduling, binding, and allocation for the reduction of total power and power fluctuation during behaviora...
176
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VLSID
2005
IEEE
16 years 7 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
179
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VLSID
2005
IEEE
16 years 7 months ago
2005
IEEE
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...