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ITC
2003
IEEE
158views Hardware» more  ITC 2003»
15 years 11 months ago
Extraction Error Diagnosis and Correction in High-Performance Designs
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikara...
EUROPAR
2004
Springer
15 years 10 months ago
Lookahead Scheduling for Reconfigurable GRID Systems
Abstract This paper proposes an approach to continuously optimizing parallel scientific applications with dynamically changing architectures. We achieve this by combining a dynamic...
Jesper Andersson, Morgan Ericsson, Welf Löwe,...