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DATE
2006
IEEE
16 years 28 days ago
2006
IEEE
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
188
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ICDM
2006
IEEE
2006
IEEE
A Probability Distribution Of Functional Random Variable With A Functional Data Analysis Application
16 years 28 days ago
Probability distributions are central tools for probabilistic modeling in data mining, and they lack in functional data analysis (FDA). In this paper we propose a probability dist...
184
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IPPS
2006
IEEE
16 years 27 days ago
2006
IEEE
A new token-passing algorithm called AR-TP for avoiding the non-determinism of some networking technologies is presented. This protocol allows the schedulability analysis of the n...
144
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IPPS
2006
IEEE
16 years 27 days ago
2006
IEEE
Babylon v2.0 is a collection of tools and services that provide a 100% Java compatible environment for developing, running and managing parallel, distributed and mobile Java appli...
142
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IPPS
2006
IEEE
16 years 27 days ago
2006
IEEE
This paper presents TPCC-UVa, an open-source implementation of the TPC-C benchmark intended to be used in parallel and distributed systems. TPCC-UVa is written entirely in C langu...