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180
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MICRO
2011
IEEE
193views Hardware» more  MICRO 2011»
14 years 10 months ago
Voltage Noise in Production Processors
Abstract—Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is especially daunting because it happens so rapidly. We measure and ch...
Vijay Janapa Reddi, Svilen Kanev, Wonyoung Kim, Si...
229
Voted
ECCC
2011
204views ECommerce» more  ECCC 2011»
14 years 10 months ago
Dense locally testable codes cannot have constant rate and distance
A q-query locally testable code (LTC) is an error correcting code that can be tested by a randomized algorithm that reads at most q symbols from the given word. An important questi...
Irit Dinur, Tali Kaufman
202
Voted
IACR
2011
125views more  IACR 2011»
14 years 6 months ago
On Constructing Homomorphic Encryption Schemes from Coding Theory
Abstract. Homomorphic encryption schemes are powerful cryptographic primitives that allow for a variety of applications. Consequently, a variety of proposals have been made in the ...
Frederik Armknecht, Daniel Augot, Ludovic Perret, ...
ISCA
2012
IEEE
281views Hardware» more  ISCA 2012»
13 years 9 months ago
LOT-ECC: Localized and tiered reliability mechanisms for commodity memory systems
Memory system reliability is a serious and growing concern in modern servers. Existing chipkill-level memory protection mechanisms suffer from several drawbacks. They activate a l...
Aniruddha N. Udipi, Naveen Muralimanohar, Rajeev B...
163
Voted
SOCC
2008
IEEE
106views Education» more  SOCC 2008»
16 years 1 months ago
Nanoscale on-chip decoupling capacitors
— A distributed on-chip decoupling capacitor network is proposed in this paper to replace one large capacitor. A system of distributed on-chip decoupling capacitors is shown to p...
Mikhail Popovich, Eby G. Friedman